This article describes the test wrapper implementation of a popular embedded microprocessor, along with an automated approach for verifying the wrapper's compliance to the standard.
[ The complete article is available online in the IEEE's Computer Society Digital Library at http://doi.ieeecomputersociety.org/10.1109/MDT.2009.19 ]
IEEE Std 1500 and Its Usage The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper Teresa McLaurin ARM Stylianos Diamantidis and Iraklis Diamantidis Globetech Solutions Editor’s note: This article describes the test wrapper implementation of a popular embedded microprocessor, along with an automated approach for verifying the wrapper’s compliance to the standard. —Erik Jan Marinissen, IMEC Abstract
Adopting IEEE Std 1500 for core-based manufacturing test can lead to significant improvements in test planning, IP integration, and vector management. The ARM Cortex-A8 microprocessor is one of the first commercial microprocessors to incorporate a IEEE-1500-compliant wrapper, providing a fast track to a core-based test strategy.This article focuses on the design methodologies used to build and validate the ARM Cortex-A8 microprocessor wrapper. It discusses the wrapper architecture, components, and circuits, and describes the implementation of IEEE 1500 from a core provider perspective. Because interoperability is a primary concern for core providers, we also describe the compliance verification methodology that we applied to the IEEE 1500 wrapper, along with some important issues and their respective solutions.
References [1] T. McLaurin and R. Kapur, "Wrap Your Cores to Enable SOC Test," EE Times,24 Nov. 2004, http://www.design-reuse.com/articles/9228/ wrap-your-cores-to-enable-soc-test-arm-synopsys.html. [2] IEEE Std. 1500-2005, IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits, IEEE, 2005. [3] F. da Silva, T. McLaurin, and T. Waayers, The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500, Springer, 2006. [4] IEEE Std. 1450.6-2005, IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL), IEEE, 2006. [5] I. Diamantidis, T. Oikonomou, and S. Diamantidis, "Towards an IEEE P1500 Verification Infrastructure: A Comprehensive Approach," Proc. 3rd IEEE Int'l Workshop Infrastructure IP (I-IP 05), IEEE Press, 2005, pp. 25-30.
Index Terms ARM Cortex-A8 microprocessor, test, IEEE Std 1500, wrapper, compliance, verification Citation: Teresa McLaurin, Stylianos Diamantidis, Iraklis Diamantidis, "The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper," IEEE Design and Test of Computers, vol. 26, no. 1, pp. 44-51, Jan./Feb. 2009, doi:10.1109/MDT.2009.19
|
|