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[ Post-silicon | Papers ]
This paper introduces a unified DFT Verification Methodology, aimed at providing a complete, methodical and fully automated path from test specification to DFT closure. We will also examine the benefits of this approach, looking at how this methodology can help bridge the widening gap between design and test.
Design For Testability (DFT) Consulting
IEEE 1149.1 (JTAG) eVC
The JTAG eVC is capable of verifying all compliant TAPs and scan chain architectures, with enhanced automation.
[ Post-silicon | Papers ]
This brief article discusses how to plan DFT verification against test intent, ensure compatibility with standards and functional correctness, and create a complete, methodical, and fully automated path from specification to closure.
[ Post-silicon | Brochures ]
The JTAG eVC is a complete DFT verification environment capable of verifying IEEE 1149.1 test infrastructures.

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