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[ Post-silicon | Papers ]
This paper introduces a unified DFT Verification Methodology, aimed at providing a complete, methodical and fully automated path from test specification to DFT closure. We will also examine the benefits of this approach, looking at how this methodology can help bridge the widening gap between design and test.
Design For Testability (DFT) Consulting
IEEE 1149.1 (JTAG) eVC
The JTAG eVC is capable of verifying all compliant TAPs and scan chain architectures, with enhanced automation.
[ Post-silicon | Papers ]
This brief article discusses how to plan DFT verification against test intent, ensure compatibility with standards and functional correctness, and create a complete, methodical, and fully automated path from specification to closure.
[ Storage | Brochures ]
The CE-ATA eVC, based on a layered checker architecture, can be used to verify CE-ATA Hosts and Devices.

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Samsung relies on Globetech VIP for advanced verification
"Globetech's verification IP plays an instrumental role in ensuring our group minimizes verification risk. Their technical support team has provided prompt and highly competent verification expertise that has helped us meet our project specific needs."

Milind Parab, Senior Development Manager, System LSI Division, Samsung India [read more]